Raman microscopy has become an important tool for materials analysis, providing crucial information to experimentalists working in the fields of semiconductor, ceramics or composite materials. The unique confocal and spatial resolution of micro-Raman systems enables optical far field resolution to be pushed to its limits with often sub-micron resolution achievable for chemical imaging of small structures.

The next step to material analysis on a smaller scale is the combination of Raman spectroscopic analysis with near field optics and Atomic Force Microscopy (AFM). This combination enables nanometric topographical information to be coupled to chemical information. Unique designs enable Raman measurements to be made upon  different AFM units for the exploration of new and evolving techniques such as nanoRaman spectroscopy based on the TERS (tip enhanced Raman spectroscopy).

Raman Imaging is sometimes seen as rather slow in comparison to other techniques such as NIR or Fluorescence. Now, things have evolved much further, pushing the limits of systems to obtain high quality Raman images with unprecedented acquisition speeds. Recent advances in detection and hardware communication enable us to reach measurement times as low as a few ms/point, opening the door to quasi-instantaneous chemical   imaging.

In addition, HORIBA Jobin Yvon has launched a new imaging mode, the revolutionary DuoScan^TM (patent pending), which offers the best of both the micro and the macro world, as it generates Raman maps across both µm-scale and cm-scale areas with FULL coverage of your sample. When looking at large sample surfaces to measure component distribution or to search for contaminants, it often comes down to finding a needle in a haystack. The DuoScan allows you to vary the spot size from 1 µm to 300 µm to match your image pixel size, ensuring that you don’t miss a spot.

Examples emphasizing Raman capabilities in the field of semiconductor or carbon materials will be discussed.

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1. Comef Aparatura Naukowo-Badawcza