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Quantitative transmission electron microscopy for the analysis of interfaces and quantum nano-structures

Ernesto Coronel 

Uppsala University (UU), Regementsvägen 1, Uppsala SE-751 21, Sweden

Abstract

Quantitative TEM characterisation techniques have been successfully developed in the recent years. We are now able to probe physical properties such as structure, electronic and magnetic structure quantitatively with sub-Ångström to nanometer resolution. The challenge in quantitative TEM methods consists in the correlation of spectroscopic, image or diffraction intensities with the physical properties of a given sample. Several challenges must be met such as highly reproducible acquisition conditions and a quantitative understanding of the electron sample interaction. In this paper, we will present examples in which TEM techniques in quantitative electron energy loss spectroscopy (EELS) and quantitative image interpretation were developed and refined.

In tribology, hard coatings are subject to friction against metals and to understand wear, the initial states of the tribological processes are studied. The FIB is used to localise these areas of starting wear and to prepare a TEM lamella from this area. By applying energy filtered imaging (EFTEM) and high resolution TEM, we obtain atomic to nanometer scale information. This chemical information can be correlated with tribological models of wear on surfaces.

In the field of semiconductor physics, the understanding of the energy level structure of individual QDs remains non-trivial and essential to engineer the optical properties of a QD. The quantitative characterisation of the QD structure involves the localisation of the quantum dots, optimisation of the inherently low signal to noise ratios and the characterisation of the 3D structure. The correlation between QD structure and luminescence spectra through energy level calculations yielded excellent agreement.

 

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Presentation: Invited at E-MRS Fall Meeting 2007, Symposium J, by Ernesto Coronel
See On-line Journal of E-MRS Fall Meeting 2007

Submitted: 2007-06-17 16:54
Revised:   2009-06-07 00:44