Modern science and advanced technology require measurement of anisotropies and inhomogenity of various thin films and nanostructured materials with ever higher demands for precision. Classical spectroscopic ellipsometry is limited by relatively narrow gamut of incident angles. Wider range of tangential propagation constant in a material enables more accurate determination of inhomogenity and anisotropy. Methods of the total internal reflection ellipsometry (TIRE) and the surface plasmon resonance (SPR) overcome this drawback by introducing a prism between sample and incident beam and taking advantage of specific properties of noble metals. These methods are used to analyze various nanostructured solid samples and liquids with dispersed nanoparticles. Phase modulation ellipsometer UVISEL (Horiba - Jobin Yvon) with spectral range of 0.6 to 6.5 eV has been applied. The main advantage of these methods is fast nondestructive probing with high sensitivity.

Acknowledgement: Partial supports from the projects KAN 4001006VB, MSM6198910016 and the Grant Agency of Czech Republic (2002/06/0591) are acknowledged.

• Legal notice:
  

  Copyright (c) Pielaszek Research, all rights reserved.
  The above materials, including auxiliary resources, are subject to Publisher's copyright and the Author(s) intellectual rights. Without limiting Author(s) rights under respective Copyright Transfer Agreement, no part of the above documents may be reproduced without the express written permission of Pielaszek Research, the Publisher. Express permission from the Author(s) is required to use the above materials for academic purposes, such as lectures or scientific presentations.
  In every case, proper references including Author(s) name(s) and URL of this webpage: https://science24.com/paper/11460 must be provided.

1. Magnetic anisotropy of Co films annealed by laser pulses