Mike Leszczynski

e-mail:
phone: +4(0) 602391349
fax: +48 (22) 632421
web:
interest(s):

Affiliation:


Polish Academy of Sciences, Institute of High Pressure Physics

address: Sokolowska 29/37, Warszawa, 01-142, Poland
phone: +48-22-6324302
fax: +48-22-6324218
web: http://www.unipress.waw.pl

Participant:


E-MRS Fall Meeting 2002

began: 2002-09-15
ended: 2002-09-19
Presented:

Participant:


E-MRS Fall Meeting 2005

began: 2005-09-05
ended: 2005-09-09
Presented:

Participant:


Nano2business workshop

began: 2007-02-07
ended: 2007-02-09
Presented:

Nano2business workshop

Blue laser diodes manufacturing in Poland

Participant:


Joint Fith International Conference on Solid State Crystals & Eighth Polish Conference on Crystal Growth

began: 2007-05-20
ended: 2007-05-24
Presented:

Joint Fith International Conference on Solid State Crystals & Eighth Polish Conference on Crystal Growth

X-ray Diffraction as a Tool of InGaN layer Characterization.

Publications:


  1. Blue laser diodes manufacturing in Poland
  2. Bowing of epitaxial structures grown on bulk GaN substrates
  3. Built-in electric fields in group III-nitride light emitting quantum structures
  4. Microstructure of homoepitaxially grown InGaN/GaN, violet light emitting laser diodes.
  5. PLASTIC PROPERTIES OF GaN AND Al2O3 CRYSTAL: FEM-SIMULATION OF NANOINDENTATION CONFIRMED BY HIGH-RESOLUTION MICROSCOPY
  6. Polymer film-coated high electron mobility transistors, based on GaN heterostructures, as sensors for some benzene derivatives
  7. Rietveld refinement for polycrystalline indium nitride

  8. The Blue Laser
  9. The optimalisation of the GaN and GaN/AlGaN heterojunctions on bulk crystals using plasma-assisted molecular beam epitaxy
  10. X-ray Diffraction as a Tool of InGaN layer Characterization.



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