Effect of finite mobility of grain-boundary triple junctions on grain growth is studied using numerical simulation. These junctions are shown to retard grain growth, especially at small grain sizes, and can transform the growth kinetics from parabolic into linear one. It is concluded that grain-boundary junctions can contribute to microstructure stability in single-phase nanocrystalline materials. Magnitude of triple-junction mobility in nanocrystalline Fe is estimated from the experimental data on grain growth kinetics.

• Legal notice:
  

  Copyright (c) Pielaszek Research, all rights reserved.
  The above materials, including auxiliary resources, are subject to Publisher's copyright and the Author(s) intellectual rights. Without limiting Author(s) rights under respective Copyright Transfer Agreement, no part of the above documents may be reproduced without the express written permission of Pielaszek Research, the Publisher. Express permission from the Author(s) is required to use the above materials for academic purposes, such as lectures or scientific presentations.
  In every case, proper references including Author(s) name(s) and URL of this webpage: https://science24.com/paper/12340 must be provided.