- Tomasz A. Krajewski

e-mail:
phone: +48-22-8436601
fax: +48-22-8475223
web:
interest(s):

Affiliation:


Polish Academy of Sciences, Institute of Physics

address: al. Lotników 32/46, Warszawa, 02-668, Poland
phone: +48-22-8436601
fax: +48-22-8430926
web: http://www.ifpan.edu.pl

Participant:


E-MRS Fall Meeting 2009

began: 2010-09-14
ended: 2010-09-18
Presented:

E-MRS Fall Meeting 2009

Electrical and optical properties of zinc oxide layers obtained by Atomic Layer Deposition

Publications:


  1. Dimethylzinc and diethylzinc as precursors for monocrystalline zinc oxide grown by Atomic Layer Deposition
  2. Effect of annealing on electrical properties of low temperature ZnO films
  3. Effects related to deposition temperature of ZnCoO films grown by Atomic Layer Deposition – uniformity of Co distribution, structural, electric and magnetic properties
  4. Electrical and optical properties of zinc oxide layers obtained by Atomic Layer Deposition
  5. Zinc oxide grown by Atomic Layer Deposition - a material for novel 3D electronics
  6. ZnO thin films for organic/inorganic heterojunctions



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