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J.M. Yi
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Affiliation:
Pohang University of Science and Technology
address:
San 31, Hoyja-dong, Nam-gu, Pohang, 790-784,
Korea, South
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Participant:
E-MRS Fall Meeting 2004
began:
2004-09-06
ended:
2004-09-10
Presented:
E-MRS Fall Meeting 2004
Grain orientation-location measurement by combined use of x-ray topography with diffractometry
E-MRS Fall Meeting 2004
Microstructure of dislocation slip-band in p/p+ Si (001) by white beam diffraction topography and x-ray diffractometry
Publications:
Grain orientation-location measurement by combined use of x-ray topography with diffractometry
Microstructure of dislocation slip-band in p/p+ Si (001) by white beam diffraction topography and x-ray diffractometry
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