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Marcin Klepka

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Affiliation:


Polish Academy of Sciences, Institute of Physics

address: al. Lotników 32/46, Warszawa, 02-668, Poland
phone: +48-22-8436601
fax: +48-22-8430926
web: http://www.ifpan.edu.pl

Publications:


  1. Analysis of stress in buried Ge layers by means of X-ray fluorescence
  2. Electronic structure of Mn atoms in (Ga,Mn)As layers modified by high temperature annealing
  3. EXAFS investigation of the local atomic structure of di-alanino acid derivative of protoporphyrin IX
  4. Influence of high temperature annealing on the local atomic structure around Mn atoms and magnetic properties of (Ga,Mn)As layers
  5. Method of Manganese co-doping of LT ZnO films
  6. Raman spectroscopy and magnetic properties of bulk Zn0984Co0.016O crystal
  7. X-ray fluorescence detection of iron in diaminoacid derivatives of protoporhyrin IX.



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