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Ferenc Riesz

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Affiliation:

Hungarian Academy of Sciences, Research Institute for Technical Physics and Materials Science

address: P.O.Box 49, Budapest, H-1525, Hungary
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Publications:
  1. 3C-SiC growth and characterization using methyltrichlorosilane
  2. Hydroxyapatite growth on surfaces modified by CdSe or Si nanoparticles embedded in SiOx thin films
  3. Makyoh-topography study of the swirl defect in Si wafers
  4. Sub-pixel detection of a grid’s node positions for optical diagnostics



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