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dr Vasily Melnikov
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Publications:
In situ investigation of thermally influenced phase transformations in (Pb
0.92
Sr
0.08
)(Zr
0.65
Ti
0.35
)O
3
thin films using micro-Raman spectroscopy and X-ray diffraction
In situ micro-Raman analysis and X-ray diffraction of nickel silicide thin films on silicon
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