A review will be given over X-ray imaging techniques used at modern synchrotron sources (and not only there). Their principles, optical elements, physical basics will be presented. With different emphasis elements of X-ray optics, X-ray microscopy, radiography, micro-tomography and X-ray diffraction imaging (X-ray topography) will be discussed.

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1. Characterization of defects in protein crystals by means of synchrotron multiple-crystal topography and reciprocal space mapping