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Scaling of superconducting gap and critical temperature in doped Bi-2212, Bi-2201 and Hg-1201 |
Yaroslav G. Ponomarev , Svetoslav Kuzmichev , Mikhail Mikheev , Marina Sudakova , Sergeii Tchesnokov |
M.V. Lomonosov Moscow State University, Vorobyevy gory, Moscow 119992, Russian Federation |
Abstract |
High-temperature superconductivity in cuprates occurs in CuO2 planes within a relatively narrow interval of impurity hole concentration p [1]. It is well established that the transition temperature Tc varies with p according to a parabolic law. At the same time there is a conflicting information about a doping dependence of a superconducting gap Δ. In the present investigation we have measured Δ in doped Bi-2212, Bi-2201 and Hg-1201 by tunneling, Josephson and Andreev spectroscopy using a break junction technique. In particular we have studied the intrinsic Josephson effect (IJE) on natural ultrathin steps (with a height from 1.5 to 30 nm) which are always present on cryogenically cleaved surfaces of doped HTSC single crystals. For a stack of n equivalent junctions the value of the gap voltage Vgn corresponding to a sharp increase of a quasi-particle current (J||c) is given by: Vgn = (2Δ/e)n. The experimental dependence Vgn(n) has been used to determine the gap parameter Δ with high accuracy. The unusual sharpness of a gap feature in case of a highly anisotropic gap parameter could be caused by an extended van Hove singularity [1], the presence of which significantly enhances the gap structure in current-voltage characteristics for J||c [2, 3]. We have used the data of tunneling, intrinsic tunneling and Andreev spectroscopies to derive the dependence of the superconducting gap Δ on the impurity hole concentration p in Bi-2212, Bi-2201 and Hg-1201. In all cases the superconducting gap Δ(4.2 K) was found to scale with the transition temperature Tc in the entire doping range. |
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Presentation: Poster at E-MRS Fall Meeting 2006, Symposium K, by Yaroslav G. PonomarevSee On-line Journal of E-MRS Fall Meeting 2006 Submitted: 2006-05-15 11:50 Revised: 2009-06-07 00:44 |