NANOMETRIC SEMICONDUCTOR PARTICLES IN MESOPOROUS SILICA: SYNTHESIS AND CHARACTERIZATION

Maria Luisa Saladino ,  Delia Chillura Martino ,  Eugenio Caponetti ,  Lucia Pedone 

Università di Palermo (UNIPA), Viale delle Scienze, Pallermo 90128, Italy

Abstract

The synthesis and characterization of mesoporous silica (MCM41) containing semiconductor (CdS) nanoparticles is reported. MCM41 was synthesised using CTAB micelles as template [1]; its structure was determined by X-ray diffraction (XRD). CdS nanoparticles were synthesised using a water in oil microemulsion as reaction media [2]; their structure was determined by X-ray diffraction (XRD) and transmission electron microscopy.

The heptane containing CdS-amine capped nanoparticles was added to the porous silics; CdS nanoparticles spontaneously localized inside MCM41 pores giving the. The obtained hierarchical material was characterised using IR, UV-Vis, ATR, fluorescence spectroscopies and XRD and Small Angle Neutron Scattering (SANS) techniques. The spectroscopic investigation gave the size, polidispersity, surface and morphological properties of nanoparticles. SANS and XRD investigation gave structural information such as mesoporous structure, pore size and nanoparticles localization.

[1] Beck et al., J. Am. Chem. Soc. 114, 10834,1992.

[2] E. Caponetti et al., Material Science and Engineering C 23(4),531, 2003.

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Presentation: poster at E-MRS Fall Meeting 2005, Symposium F, by Maria Luisa Saladino
See On-line Journal of E-MRS Fall Meeting 2005

Submitted: 2005-06-01 08:56
Revised:   2009-06-07 00:44
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