X-ray diffuse scattering study of defects in α-sapphire

Jerzy Gronkowski ,  Elżbieta Zielińska-Rohozińska ,  Janusz Borowski 

Warsaw University, Institute of Experimental Physics (IEP UW), Hoża 69, Warszawa 00-681, Poland


Sapphire single crystals have been widely studied in the past few decades because this material is used on a large scale as substrate for the epitaxial technique, e.g. in the laser and light emitting diode fabrication. Various dislocations with different Burgers vectors were studied by x-ray topography [1-3]. Theoretical and experimental results of x-ray topographical investigations of perfect dislocations were reported in [4]. In the present study 006 reflection CuKα1 maps from both sides of α-Al2O3 substrate were taken in the triple-axis mode. The obtained isointensity contour shapes revealed features resembling those from dislocation loops in other materials. In order to identify the defects the isocontours were simulated using the double-force tensor approach [5] applied to hexagonal crystals [6, 7].

[1] Y. Takano, K. Kohn, S. Kikuta, K. Kohra, J. Appl. Phys. (1970) 847.

[2] J.L. Caslavsky, C.P. Gazzara, R.M. Middleton, Phil. Mag. 25 (1972) 35.

[3] J.L. Caslavsky, C.P. Gazzara, Phil. Mag. 26 (1972) 961.

[4] C. G'Sell, Y. Epelboin, J. Appl. Crystallogr. 12 (1979) 110.

[5] H. Trinkaus, phys. stat. sol. (b) 51 (1972) 307.

[6] Th. Michelitsch, A. Wunderlin, phys. stat. sol. (b) 198 (1996) 615.

[7] Th. Michelitsch, phys. stat. sol. (b) 203 (1997) 3.

Legal notice
  • Legal notice:

    Copyright (c) Pielaszek Research, all rights reserved.
    The above materials, including auxiliary resources, are subject to Publisher's copyright and the Author(s) intellectual rights. Without limiting Author(s) rights under respective Copyright Transfer Agreement, no part of the above documents may be reproduced without the express written permission of Pielaszek Research, the Publisher. Express permission from the Author(s) is required to use the above materials for academic purposes, such as lectures or scientific presentations.
    In every case, proper references including Author(s) name(s) and URL of this webpage: http://science24.com/paper/3878 must be provided.


Related papers
  1. X-ray high-resolution diffraction study of GaInAs and GaAsP grown by a modified Czochralski method

Presentation: poster at E-MRS Fall Meeting 2005, Symposium F, by Jerzy Gronkowski
See On-line Journal of E-MRS Fall Meeting 2005

Submitted: 2005-06-01 07:30
Revised:   2009-06-07 00:44
Web science24.com
© 1998-2021 pielaszek research, all rights reserved Powered by the Conference Engine