X-ray diffuse scattering study of defects in α-sapphire
|Jerzy Gronkowski , Elżbieta Zielińska-Rohozińska , Janusz Borowski|
Warsaw University, Institute of Experimental Physics (IEP UW), Hoża 69, Warszawa 00-681, Poland
Sapphire single crystals have been widely studied in the past few decades because this material is used on a large scale as substrate for the epitaxial technique, e.g. in the laser and light emitting diode fabrication. Various dislocations with different Burgers vectors were studied by x-ray topography [1-3]. Theoretical and experimental results of x-ray topographical investigations of perfect dislocations were reported in . In the present study 006 reflection CuKα1 maps from both sides of α-Al2O3 substrate were taken in the triple-axis mode. The obtained isointensity contour shapes revealed features resembling those from dislocation loops in other materials. In order to identify the defects the isocontours were simulated using the double-force tensor approach  applied to hexagonal crystals [6, 7].
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Presentation: poster at E-MRS Fall Meeting 2005, Symposium F, by Jerzy Gronkowski
See On-line Journal of E-MRS Fall Meeting 2005
Submitted: 2005-06-01 07:30 Revised: 2009-06-07 00:44
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