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The new SEM analysis reality from Bruker |
Thomas Grafe |
Bruker Nano GmbH, Berlin 12489, Germany |
Abstract |
Having 5 cutting edge analytical tools for SEM out of one source now becomes reality. Discover the new Bruker range offering EDS, EBSD, WDS, Micro–CT and Micro-XRF analysis opening up unrivalled analytical possibilities. |
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Presentation: Invited oral at Nano and Advanced Materials Workshop and Fair, by Thomas GrafeSee On-line Journal of Nano and Advanced Materials Workshop and Fair Submitted: 2013-08-01 11:26 Revised: 2013-08-01 11:26 |