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Growth, structure and dielectric properties of two dimensional La2-xSrxCoO4 crystals

Shuhua Yao 1Ning Sun 1Binbin Zhang 1Songtao Dong 1Yanbin Chen 2

1. Department of Materials Science and Engineering, Nanjing University (NJU), Nanjing 210093, China
2. National Laboratory of Solid State Microstructures, Department of Physics, Nanjing University (NJU), Hankou Road 22#, Nanjing 210093, China

Abstract

La2−xSrxCoO4 (x = 0.4, 0.5, 0.6) crystals with Ruddlesden-Popper K2NiF4-type structure have been investigated as potential dielectric application. In this report, La2−xSrxCoO4−δ crystals have been grown by Floating Zone. Rietveld refinement revealed that these compounds are crystallized in K2NiF4-type structures with space group I4/mmm. It was found that the lattice parameter c decreases as x increases. The phonon spectra of La2−xSrxCoO4 have been investigated by Raman spectroscopy. Dielectric properties of La2-xSrxCoO4 crystals were studied in a broad frequency and temperature range. The dielectric relaxation should be attributed to the non-adiabatic small polaroic hopping. There was one obvious dielectric relaxation around room temperature. This dielectric relaxation was a thermal-activated process. It should be attributed to the mixed-valence structure (Co2+/Co3+) since its activation energy was similar to that of small polaronic hopping process.

 

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Presentation: Poster at 17th International Conference on Crystal Growth and Epitaxy - ICCGE-17, Topical Session 9, by Shuhua Yao
See On-line Journal of 17th International Conference on Crystal Growth and Epitaxy - ICCGE-17

Submitted: 2013-05-17 17:11
Revised:   2013-05-20 11:30