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Growth of atomically-smooth droplet-free AlxGa1-xN (x>0.5) layers by plasma assisted molecular beam epitaxy under strong metal-rich conditions |
Dmitrii Nechaev 1, Valentin N. Jmerik 1, Pavel N. Brunkov 1, Sergey I. Troshkov 1, Ahmed Y. Alyamani 2, Sergey V. Ivanov 1 |
1. Ioffe Physico-Technical Institute, RAS, Saint-Petersburg, Russian Federation |
Abstract |
Plasma assisted molecular beam epitaxy (PA MBE) is one of the main technologies for manufacturing AlGaN heterostructures with a high Al content, emitting within wide UV spectral range down to a wavelength of 210 nm. The structural quality of UV-emitting devices can be improved by a precise control of the stoichiometric conditions during PA MBE that allows one to grow AlGaN layers with either rough or atomically smooth droplet-free surface morphology at the nitrogen- or metall-rich conditions, respectively. The paper reports on growth kinetics of AlxGa1-xN films with high Al content (x>0.5) at the metal-rich conditions. Also we propose a new pulsed growth technique to achieve the atomically-smooth droplet-free film surface. |
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Presentation: Poster at 17th International Conference on Crystal Growth and Epitaxy - ICCGE-17, Topical Session 3, by Dmitrii NechaevSee On-line Journal of 17th International Conference on Crystal Growth and Epitaxy - ICCGE-17 Submitted: 2013-04-11 10:44 Revised: 2013-04-16 17:32 |