Ni films were electrodeposited onto polycrystalline gold substrates mounted on a rotating disk electrode. The effect of rotating speed, film thickness and current density on the kinetic roughenin of the electrodeposited films were investigated. The film roughness surface was imaged using an atomic force microscope (AFM). The results indicate that the film roughness increases as the film thickness or the current density increase. We found that the electrodeposited Ni films exhibit anomalous scaling since both the local and long-scale roughness show a power law dependence of the film thickness. The effect of electrode rotating speed on the film thickness is also investigated. 

1. FULLTEXT: Surface roughness analysis of Ni thin films electrodeposited onto rotating disk electrodes, Microsoft Office Document, 0MB

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