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Characterization of intermediate phases of Y-RE oxides by using image plate Guinier camera

Giora Kimmel ,  Jacob Zabicky ,  Elena Goncharov ,  Dimitry Mogiliansky ,  Joseph Gal 

Ben-Gurion University of the Negev, P.O.Box 653, Beer-Sheva 84105, Israel


In a project of formation and characterization of intermediate phases between Y2O3 and RE2O3 (RE=rare earth element), we collected data using a new image plate Guinier camera installed (670 Huber) on a rotating Cu anode source (Ultrax 18 Rigaku), with a monochromator attached to the source providing Kα1 radiation. This configuration enables fast scanning with high resolution. However, there are some limitations like: (a) the angle range is limited; (b) it is impossible to filter inelastic scattering; (c) in transmission mode only a small amount of powder can be loaded.
In order to evaluate the instrument quality we collected data from two sets of binary oxides Dy2xY2-2xO3 and Gd2xY2-2xO3 (0<x<1). The materials prepared by sol-gel technique, providing almost ideal samples for powder diffraction. The xerogel products were fired at different temperatures from 200 to 1400C resulting in powders with grain size from nano to micro. Nine intermediate phases were prepared. The crystal data were refined by the Rietrveld method. The scanning range was 5<2θ<100. The results were compared with previous references.

In spite of the camera limitations excellent results were obtained. The cell parameters found to be highly accurate. The RBragg for the intensities were between 0.02 and 0.06. The intensity quality for crystal refinement was better for the Y-rich samples, due to lower fluorescence emission and after firing at temperatures between 700 and 1000C due to optimal grain size for powder diffraction. A comparison of the above results with a conventional Bragg-Brentano diffractometer will be given for selected samples.


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Presentation: poster at E-MRS Fall Meeting 2004, Symposium D, by Giora Kimmel
See On-line Journal of E-MRS Fall Meeting 2004

Submitted: 2004-06-21 22:48
Revised:   2009-06-08 12:55