The X-Ray powder diffraction is, at present, the main application area of the silicon strip detector. Several prototypes of the detector dedicated to diffraction applications were developed by Dąbrowski, Gryboś and others [1], [2]. The presented results are obtained with the 128-channel strip silicon detector (with strip pitch 100 μm) installed at XPert diffractometer [3].
Experiments with powders were performed with use as follows: Ni-filtered Cu-radiation, Bragg-Brentano geometry, and Si and LaBi6 standard samples. Experiments were focused on the analysis of the diffraction peaks profile [4], [5]. The presented results will show: (a) effect of defocusing of the diffraction peak resulting from its registration off the focusing point (noticeable for small diffraction angles only), (b) the importance of Soller slits for reducing the effect of axial aberrations, and (c) measurement of the peak width as a function of the diffraction angle. The value obtained at small angles amounts about 0,05 deg.
The standard LiF 200-oriented crystal was used for single-crystal experiments. The scan through 002 and 004 inverse lattice points demonstrate the high dynamic range of the detector, since the counts change in the range between 20 imp/s and 50 000 imp/s. The high reflectivity of the crystal allows to reach experimentally the limit of the counting rate of the examined silicon strip detector. (In experiments with polycrystals and thin films the detector counting rate will always be sufficient.)

[1] P. Gryboś and W. Dąbrowski, IEEE Trans. Nucl. Science Vol. 48 (2001) 466
[2] P. Gryboś, W. Dąbrowski, P. Hottowy, R. Szczygieł, K. Świentek, and P. Wiącek, Microelectronics & Reliability, 42 (2002) 427
[3] A. Zięba, W. Dąbrowski, P. Gryboś, W. Powroźnik, J. Słowik, T. Stobiecki, K. Świentek, P. Wiącek, Mat. Sci. Forum 443-444 (2004) 175
[4] J. Słowik, A. Zięba, J. Appl. Cryst. 34 (2001) 458C
[5] J. Słowik, Ph. D. Thesis, AGH University of Science and Technology

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1. Quantifying uncertainty of the intensity of diffraction peak due to crystallite statistics