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Fractal and Symbolic Methods for Nanomaterials Science and Nanosensors |
Wlodzimierz KLONOWSKI , Elzbieta OLEJARCZYK , Robert STEPIEN |
Polish Academy of Sciences, GBAF, Medical Research Center (CMDiK PAN), Pawinskiego 5, Warszawa 02-106, Poland |
Abstract |
Calculating materials properties from structural models has long been one of the most important problems of Materials Science (cf. [1]). There is still a need for relatively simple methods of assessment of material properties, especially surface properties, based on analysis of experimental data such as microscopic images. Fractal and symbolic methods of image and signal analysis can be very useful for these purposes. Fractal dimension of a surface in 3-dimensional space, Ds , may be assessed based on fractal dimension of an image of this surface on a plane. Fractal dimension is invariant with respect to linear scale transformations and it is simply related to power spectrum exponent β - an image of a fractal Brownian surface with the power spectrum proportional to f -β shows power spectrum proportional to f 2-β, where β/2 = (3 - Ds) (cf. [2]).
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Presentation: oral at E-MRS Fall Meeting 2004, Symposium H, by Wlodzimierz KLONOWSKISee On-line Journal of E-MRS Fall Meeting 2004 Submitted: 2004-05-20 14:20 Revised: 2009-06-08 12:55 |