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Two materials studies on residual background carriers and density dependent carrier mobilities in InAs/GaSb superlattices |
Frank Szmulowicz 1, Said Elhamri 2, Heather J. Haugan 3, Bruno Ullrich 4, Gail J. Brown 5, William C. Mitchel 5 |
1. University of Dayton Research Institute (UDRI), 300 College Park Ave., Dayton, OH 45469, United States |
Abstract |
Material properties of InAs/GaSb type-II superlattices (SLs) are sensitive indicators of SL growth quality and of the eventual performance of devices made from these materials. In InAs/GaSb SLs, electrons move predominantly in the InAs layer, where they are affected by intrinsic and extrinsic scattering mechanisms, including interface roughness scattering (IRS).. The mid-infrared 7 ML InAs/8 ML GaSb superlattices (SLs) were grown by molecular beam epitaxy at growth temperatures between 370 and 430 C in order to study the intrinsic characteristic of background carriers. Grown SLs were all residual p-type with carrier densities in the low 1011 cm-2, and a minimum density of 1.8x1011 cm-2 was obtained from the SL grown at 400 C. With increasing growth temperature, the in-plane carrier mobility decreased from 8740 to 1400 cm2/Vs due to increased interfacial roughness, while the |
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Presentation: Oral at E-MRS Fall Meeting 2009, Symposium D, by Frank SzmulowiczSee On-line Journal of E-MRS Fall Meeting 2009 Submitted: 2009-06-21 23:43 Revised: 2009-08-25 11:16 |