Search for content and authors |
OIM and X-ray texture analysis of melt-textured YBCO superconductors |
Anjela D. Koblischka-Veneva 2, Michael R. Koblischka 1, F Mücklich 2, M. Murakami 3,4 |
1. University of Saarbruecken, Institute of Experimental Physics (USAAR), P.O.Box 151150, Saarbrücken 66041, Germany |
Abstract |
In this contribution, we compare the results of an X-ray based pole figure texture analysis with the local texture analysis by means of Orientation imaging microscopy (OIM) technique. As samples, we employ two different melt-textured YBCO samples; one fully processed and one without oxygen treatment. To enable the direct comparison of the two techniques, we employ the [103] pole figures. The OIM results are presented in form of phase maps, misorientation angle distributions and two-dimensional pole figures. The X-ray texture data are presented in form of two- and three-dimensional [103] pole figures.
|
Legal notice |
|
Related papers |
Presentation: poster at E-MRS Fall Meeting 2004, Symposium E, by Anjela D. Koblischka-VenevaSee On-line Journal of E-MRS Fall Meeting 2004 Submitted: 2004-04-29 17:01 Revised: 2009-06-08 12:55 |