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OIM and X-ray texture analysis of melt-textured YBCO superconductors
|Anjela D. Koblischka-Veneva 2, Michael R. Koblischka 1, F Mücklich 2, M. Murakami 3,4|
1. University of Saarbruecken, Institute of Experimental Physics (USAAR), P.O.Box 151150, Saarbrücken 66041, Germany
In this contribution, we compare the results of an X-ray based pole figure texture analysis with the local texture analysis by means of Orientation imaging microscopy (OIM) technique. As samples, we employ two different melt-textured YBCO samples; one fully processed and one without oxygen treatment. To enable the direct comparison of the two techniques, we employ the  pole figures. The OIM results are presented in form of phase maps, misorientation angle distributions and two-dimensional pole figures. The X-ray texture data are presented in form of two- and three-dimensional  pole figures.
Presentation: poster at E-MRS Fall Meeting 2004, Symposium E, by Anjela D. Koblischka-Veneva
See On-line Journal of E-MRS Fall Meeting 2004
Submitted: 2004-04-29 17:01 Revised: 2009-06-08 12:55