Prethreshold photo- and exoelectron emission to  characterize nanostructures for biomedical applications  

Yuri Dekhtyar 

Institute of Biomedical Engineering and Nanotechnologies of the Riga Technical University (BINIRTU), 1 Kalku, Riga LV1658, Latvia

Abstract

Advances in nanotechnologies need non-destructive characterization methods. To reach this, electron emission measurements, when energy to escape an electron from a tested object is not enough to destroy its molecular/atomic couples, are employed as such energies have values ~ 0.1-1 eV for non-destructive characterization. The excited electron has a mean free path (L) ~ 100-10 nm1, correspondingly within the analysed emitter. These values of L fit sizes of nanostructures. This is a key point to apply electron emission for nanomaterials characterization. The paper is targeted to consider a prethreshold photo- and exo- electron emissions and their capabilities in respect with nanostructures characterization.

The report demonstrates that photo and exo emission measurements are capable to supply sensitive, accurate, and non-contact technique for the needs of nanotechnologies. The  techniques are directed to measure the electron work function (to characterise surface potential), distribution of the electron states density;  energy gap and charge relaxation; concentration of the point type imperfections, their annealing and migration (EE).

The examples to characterise natural baiomaterials as well as nanoparticles, nanomultilayer systems for biomedical field are considered.  

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Presentation: Invited oral at E-MRS Fall Meeting 2009, Symposium F, by Yuri Dekhtyar
See On-line Journal of E-MRS Fall Meeting 2009

Submitted: 2009-05-06 10:26
Revised:   2009-08-25 11:38
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