The existence and magnitude of long range elastic strains (and thus stresses) in dislocation cell interiors and walls in deformed metals have been the subject of extensive investigation for more than 20 years.  Although numerous volume-averaged measurements have been used to infer their existence, direct measurements were not possible before the advent of high-resolution focused synchrotron X-rays.  We have used depth-resolved submicrometer X-ray beams to directly measure diffraction line profiles from deeply buried individual dislocation cell interiors and cell walls in plastically deformed copper single crystals.  In the cell interiors, these spatially resolved measurements found large compressive elastic strains in the unloaded tension-deformed specimen and large tensile elastic strains in the unloaded compression-deformed specimens.  The elastic strains in the cell walls were reversed with respect to those in the cell interiors.  All of these results are qualitatively consistent with the Mughrabi composite model.  The strains also exhibited large cell-to-cell variations that have important implications for theories of dislocation structure evolution, dislocation transport, changes in mechanical properties during reverse loading (Bauschinger effect and fatigue), and the extraction of dislocation structure parameters from X-ray line profiles. 

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