www.schaefer-tec.com

On May 1, 2007 Schaefer Technologie GmbH have been appointed as exclusive distributor and marketing partner for the XE-Series of scanning probe microscopes manufactured by Park Systems Corp. (former PSIA) in Germany, Austria, Switzerland and Eastern Europe.

The innovative XE AFM product line resolves the problems of non-linearity and non-orthogonality associated with conventional piezo scanners. The z scanner, that controls the vertical movement of the AFM cantilever, is completely decoupled from the x-y scanner which moves the sample in the horizontal plane. Fast z-servo response enables True Non-Contact mode AFM measurements.

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