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Surface morphology and film structure of poly[3-(4-octyloxyphenyl) thiophene (POOPT) thin films obtained by thermal annealing during Matrix Assisted Pulsed Laser Evaporation (MAPLE) |
Valeria Califano 1, Francesco Bloisi 1,2, Luciano Vicari 1,2, Antonio Cassinese 1,2, Mario Barra 1, Antonio Carella 3, Antonio Roviello 3 |
1. INFM - Coherentia, Via Cinthia, Napoli 80125, Italy |
Abstract |
Among other materials semiconducting conjugated polymers are used in several organic electronic devices (OED) such as field effect transistors (FET), light emitting diodes (LED), photovoltaic cells (PC). Polythiophenes are attracting some attention for their chemical stability and structural versatility. Furthermore, alkyl-substituted polythiophenes have self-p-stacking ability, and p-stacking structures are essential for the optical and electrical properties of these polymers. The morphology and the structure of a polymeric thin film can highly affect its properties and, therefore, the behaviour of the OED. Since morphology and structure are affected by temperature, post-deposition annealing/quenching has been used to enhance the performance of OEDs. Currently organic or polymeric thin films are successfully deposited using Matrix Assisted Pulsed Laser Evaporation (MAPLE), an evolution of Pulsed Laser Deposition (PLD) reducing the risk of photochemical decomposition produced by direct interaction of laser radiation with the material since the target, reached by the laser beam, is a dilute frozen solution of the polymer in a volatile solvent. We have already successfully used MAPLE technique in order to deposit POOPT thin films on glass substrate and here we examine the effect of substrate temperature during depositions (deposition/annealing), comparing the results with annealing applied after MAPLE deposition (post-annealing). |
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Presentation: Poster at E-MRS Fall Meeting 2008, Symposium B, by Valeria CalifanoSee On-line Journal of E-MRS Fall Meeting 2008 Submitted: 2008-05-29 13:25 Revised: 2009-06-07 00:48 |