amorphous materials - x-ray studies
University of Silesia, Institute of Material Science, Bankowa 12, Katowice 40-007, Poland
In this paper there is presented the general view on the experimental aspects of amorphous material structure analysis for different kind of materials (e.g. thin amorphous films). From the classical point of view the structure of the amorphous materials might be done by the Radial Distribution Function and Pair Distribution Function analyses. The radii and numbers of coordination spheres are the results of such analyses. Basing on that information it is possible to create the spherical structure model of the amorphous material. Moreover, comparing the received values to the values characteristic for the typical crystalline structure models it is possible e.g. to guess the way of crystallization process. Basing on the "microcrystalline structure model" the Rietveld method might be used for refinement of the "unit cell" of searching material and further for the crystallite size, and lattice strain calculations or the calculation of the change of unit cell parameters etc. The results are comparable with the results of other experimental method as HREM.
Presentation: Poster at E-MRS Fall Meeting 2008, Symposium G, by Małgorzata Karolus
See On-line Journal of E-MRS Fall Meeting 2008
Submitted: 2008-05-12 13:32 Revised: 2009-06-07 00:48
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