Two special time-of-flight diffractometers are used for residual stress measurements at FLNP JINR at IBR-2 pulsed reactor in Dubna, Russia. These are High Resolution Fourier Diffractometer (HRFD) [1] and Fourier Stress Diffractometer (FSD) [2] and their principle operation is based on an application of the reverse time-of-flight (RTOF) method – a kind of correlation technique – at long pulsed neutron sources. Such a way, high resolution in interplanar spacing (Dd/d»1´10^-3) can be achieved, while maintaining high flux at the instrument. The main advantage of the RTOF-method, as well as of the usual TOF-method, is the possibility to measure simultaneously several reflections, fact which allows to determination the residual strains along various (hkl) directions in a crystal. Moreover, the HRFD resolution function has rather simple dependence on interplanar spacing d, which allows one to easily estimate microstrain averaged on all (hkl) directions from analysis of width of several diffraction peaks.

Nowadays, all necessary equipments for a such an experiment (the linear scanner, 5-axis goniometer "HUBER" for a measurement of the full residual strain tensor, the loading machine "TIRA-test" for in-situ experiments and definitions of materials elastic properties, a mirror furnace for an investigation of materials at high temperatures [up to 1000°С]) are operable. All of these devices can be used simultaneously that allows expanding experiment’s opportunities and for example allows defining the dependence of material elastic properties on temperature etc.

This work presents the results obtained from residual stress measurements in various materials and devices spent in FLNP JINR.

1. V.L.Aksenov, A.M.Balagurov, V.G.Simkin, V.A.Trounov, P.Hiismaki et al., J.Neutron Research, v.5, p.181, 1997.
2. A.M. Balagurov, G.D. Bokuchava, E.S. Kuzmin, A.V. Tamonov, V.V. Zhuk., Zeitschrift fur Kristallographie, 2006, Supplement Issue no. 23, pp.217-222.

• Legal notice:
  

  Copyright (c) Pielaszek Research, all rights reserved.
  The above materials, including auxiliary resources, are subject to Publisher's copyright and the Author(s) intellectual rights. Without limiting Author(s) rights under respective Copyright Transfer Agreement, no part of the above documents may be reproduced without the express written permission of Pielaszek Research, the Publisher. Express permission from the Author(s) is required to use the above materials for academic purposes, such as lectures or scientific presentations.
  In every case, proper references including Author(s) name(s) and URL of this webpage: https://science24.com/paper/15422 must be provided.