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Probing the fluorite-pyrochlore phase boundary in bismuth oxides

Julia L. Payne ,  Ivana Radosavljevic Evans 

Department of Chemistry, University of Durham, Science Labs, South Road, Durham DH1-3LE, United Kingdom

Abstract

Oxides based on fluorite (MO2) and pyrochlore (A2B2O7) have potential uses in devices such as solid-oxide fuel cells and oxygen sensors, arising from their oxide ion conductivity.  The high temperature Bi2O3 polymorph, δ-Bi2O3, adopts the cubic defect fluorite structure, where 25% of the oxygen sites are vacant and the vacancies are distributed statistically.  Relative to fluorite, in a typical pyrochlore structure, A2B2O7, only 12.5% of the oxygen sites are vacant, but the vacancies are ordered. 
It has been widely reported that the formation of the pyrochlore structure over the fluorite structure depends on the cation radius ratio, rA/rB, with the pyrochlore forming in the range 1.46-1.78 [1].  This ratio may be adjusted by aliovalent or isovalent doping of the cation sites, which can also induce anion disorder [2].  This is especially important in the pyrochlore structure, where the oxide ion vacancies are usually ordered, hence the creation of anion disorder should result in a greater oxide ion conductivity.
Our current research efforts are focused on probing the fluorite-pyrochlore structural phase boundary in (Bi,Zr)4O7 – Bi2B2O7 (B = Ti, Sn, Hf) systems.  We have recently determined a fluorite – pyrochlore phase boundary in the (Bi,Zr)4O7 – Bi2Ti2O7 system.  Here we present some results of our recent synthetic work and in-situ variable temperature powder XRD studies.

1.  M.A. Subramanian, G. Aravamundan & G.V. Subba Rao, (1983), Prog. Solid St. Chem. 15, 55-143
2.  B.J.Wuensch, K.W. Eberman, C. Heremans, E.M. Ku, P. Onnerud, E.M.E Yeo, S.M.Haile, J.K.Stalick, J.D. Jorgensen, (2000), Solid State Ionics, 129, 111-133

 

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Presentation: Poster at 11th European Powder Diffraction Conference, Poster session, by Julia L. Payne
See On-line Journal of 11th European Powder Diffraction Conference

Submitted: 2008-04-29 16:05
Revised:   2009-06-07 00:48