Using X-ray diffraction techniques residual stress analysis (RSA) on polycrystalline material can be classified in two different methods in respect of data acquisition. The widely-used angle-dispersive (AD) method is based on scanning the Bragg angle to obtain diffraction lines in discrete positions on the 2q-scale. On the other hand, applying the energy-dispersive (ED) approach, complete energy diffraction spectra containing a multitude of diffraction lines are recorded under fixed geometrical conditions.

Both techniques are complementary, however they have their specific field of application. AD-RSA experiments being usually performed in the lab with X-rays between about 5 keV and 17 keV, are sensitive within a small surface layer of some 10 µm and therefore, well-suited for the detection of very steep residual stress gradients generated, for example, in thin films. ED-RSA using high energy photons up to 100 keV and more allow for higher penetration depths of some hundred microns, which is the transition zone between the biaxial surface and the triaxial volume stress state in the bulk of the material.

An important consequence, which follows from the different data acquisition modes concerns the information being available from AD- and ED diffraction, respectively. ED experiments with the objective of the depth resolved analysis of residual stress gradients benefit from the different energies of the individual diffraction lines E(hkl) in the recorded spectrum, since each line derives from another average information depth. This additional parameter can be used to apply and advance various methods such as the ‘Multi-wavelength method’, the ‘Universal-plot method’ or the ‘Scattering vector method’ developed for the AD mode to the ED case of diffraction.

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