A single-crystal analyzer is one of the best choices as an X-ray optical device for obtaining high angular resolution and low background intensities in powder and thin-film diffraction experiments. Highest performances regarding the angular resolution and intensities can be obtained when a single-crystal analyzer is coupled with a parallel-beam geometry. In synchrotron radiation (SR) experiments, a high brilliance parallel beam can be obtained from undulator or even bending magnet light sources. A single-crystal analyzer has been commonly used for diffractometer scans at many beam-lines at SR facilities worldwide. Intensity gains in high-angular-resolution and high-speed experiments at several SR facilities around the world have been further multiplied by using multiple-detector systems, each of which consists of several perfect crystal analyzers. With a laboratory X-ray source, diffracted intensities from a single-crystal analyzer are lower than those from a SR source. A popular way to improve high diffraction intensities is to use a rotating anode generator and/or a graded multi-layer mirror. Another way may be the use of a multiple-detector system similar to those presently used in several SR facilities. However, the latter choice makes the diffractometer system more complex and also very expensive.
   In the present study, a new high-performance diffracted-beam analyzer consisting of several perfect crystals in a simple and compact device is proposed to increase the diffracted intensities by one order of magnitude compared to those of a single-crystal analyzer. It is commonly believed that an analyzer with high angular resolution cannot be used together with one- or higher-dimension detectors. In this presentation, a new technique using a diffracted-beam analyzer with multiple single crystals together with a one-dimensional silicon strip detector will be presented.

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