By deformation from low to high strains, the deformation microstructure typically refines from the micrometre to the nanometre range by subdivision of the original grains. During this subdivision, geometrically necessary boundaries (GNBs) and incidental dislocation boundaries (IDBs) develop [1]. Large misorientations evolve across the GNBs while lower misorientations are observed across the IDBs [1]. An important question is, therefore, if the distribution of crystallographic orientations in the deformation microstructure becomes randomised, or if orientation correlations exist. This is, in particular, relevant after deformation to very large strains.

In the present presentation, possible orientation correlations are investigated in aluminium deformed up to strains of 10. The investigation is based on SEM/EBSP as well as TEM/Kikuchi pattern analysis. The results are compared to results from an investigation of recrystallised samples and effects of processing procedure are discussed.

[1] N. Hansen et al. These Proceedings

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1. Microstructure Development in 3D studied by Synchrotron X Rays