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prof Olivier Thomas
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Affiliation:
Aix-Marseille Université, Institut Matériaux Microélectronique Nanosciences de Provence
address:
, Marseille, 13397,
France
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Participant:
11th European Powder Diffraction Conference
began:
2008-09-19
ended:
2008-09-22
Presented:
11th European Powder Diffraction Conference
Strain measurements at the nanoscale: microbeam Laue scattering and coherent diffraction.
Publications:
Influence of crystallographic orientation on local strains in silicon: a combined High-Resolution X-Ray Diffraction and Finite Element Modelling investigation
Investigating interdiffusion in Cu/Ni multilayers from x-ray diffraction and kinetic simulation
Strain measurements at the nanoscale: microbeam Laue scattering and coherent diffraction.
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