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Tomasz Wόjtowicz

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Affiliation:

SIFCOM, UMR6176, CNRS-ENSICAEN

address: 6 Bld Maréchal Juin, Caen, 14050, France
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Publications:

  1. Structural analysis of the behaviour of the ultrathin AlN capping layer interface during the RE implantation and annealing of GaN for electroluminescence applications



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