The new SEM analysis reality from Bruker

Thomas Grafe 

Bruker Nano GmbH, Berlin 12489, Germany

Abstract

Having 5 cutting edge analytical tools for SEM out of one source now becomes reality.

Discover the new Bruker range offering EDS, EBSD, WDS, Micro–CT and Micro-XRF analysis opening up unrivalled analytical possibilities.

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Presentation: Invited oral at Nano and Advanced Materials Workshop and Fair, by Thomas Grafe
See On-line Journal of Nano and Advanced Materials Workshop and Fair

Submitted: 2013-08-01 11:26
Revised:   2013-08-01 11:26
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