The different approaches available for the structural and microstructural analysis of nanostructured materials via powder diffraction can be broadly classified either as top-down or bottom-up. In the first case (e.g. Whole Powder Pattern Modelling ,WPPM) the parameters of a microstructure model are directly refined on diffraction data whereas in the second case (e.g. computer modelling followed by Debye approach), atomic positions in a model cluster should be modified until a match between model and diffraction experiment is obtained. Some features of the currently available methods and their possible limitations will be presented and discussed.

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