Purpose of this paper is to elaborate X–ray diffraction methodology for to characterize some chosen qualitative parameters of products made of AE and HP Distalloys. The beneficial feature of diffraction methods is non-destructive character and large number structural informations contained in diffraction pattern. Therefore they have potential ability in application to technological operations and fatigue or corrosion life control.

Design/methodology/approach. The qualitative and quantitative phase analysis (Tab.1) classical sin²? and modified g-sin²? methods were used (Tab.2). The profile diffraction line analysis (PDLA) was used to lattice distortion <e> and to average crystalline size evaluation. All methods were elaborated for both i.e. classical Bragg-Brentano (BB) and grazing incidence angle X-ray diffraction (GID) geometry. In the case of last one, the mentioned above properties can be scanned versus depth under surface in non–destructive way

Tab.1. Results of QXDPA with texture correction method and GID geometry. Wavelength lCoK_a, RA – retained austenite (non-destructive mode).

Tab.2. Tab.2. Results of residual macro-stresses in measured points on samples. Wavelength lCoK_a, direction of measurement for residual stress: x - longitudinal,  y– transverse, diffraction line {211}Fe_a, , σ_x, σ_y –sin²y  method, σ_x – g-sin²y  method.

Findings in this type of sintered samples diffusion growth in solid along grains take place during sintering. The gradients of elements concentration versus grain cross-section and the irregular space distribution of retained austenite make this alloy as composite with gradient-like microstructure. This gradient-like structure is confirmed here by residual macroscopic stresses measurement, quantitative X ray diffraction phase analysis, micro-stresses and texture factor.

Research limitations/implications. The irregular distribution of retained austenite indicates to no uniformity in larger scale then the irradiated volume due to particular X-ray diffraction method (compared results for BB and GID diffraction). The ability of X-ray diffraction methods based on  GID geometry to scan structural properties layer by layer is promising to this type of composite-like materials. Whole these results confirm non-uniformity of structural and phase composition. This approach can be used to characterize structural properties of thin surface layer or film invisible with traditional geometry.

Practical implications Relations between above structural features and some properties at selected points on the samples will hopefully provide more general concluding and beneficial issues in term of quality of sinters.

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