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prof Mike Leszczynski
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phone:
+48-0-602391349
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Affiliation:
Polish Academy of Sciences, Institute of High Pressure Physics
address:
Sokolowska 29/37, Warszawa, 01-142,
Poland
phone:
+48-22-6324302
fax:
+48-22-6324218
web:
http://www.unipress.waw.pl
Participant:
E-MRS Fall Meeting 2002
began:
2002-09-15
ended:
2002-09-19
Presented:
Participant:
E-MRS Fall Meeting 2005
began:
2005-09-05
ended:
2005-09-09
Presented:
Participant:
Nano2business workshop
began:
2007-02-07
ended:
2007-02-09
Presented:
Nano2business workshop
Blue laser diodes manufacturing in Poland
Participant:
Joint Fith International Conference on Solid State Crystals & Eighth Polish Conference on Crystal Growth
began:
2007-05-20
ended:
2007-05-24
Presented:
Joint Fith International Conference on Solid State Crystals & Eighth Polish Conference on Crystal Growth
X-ray Diffraction as a Tool of InGaN layer Characterization.
Participant:
E-MRS Fall Meeting 2009
began:
2010-09-14
ended:
2010-09-18
Presented:
E-MRS Fall Meeting 2009
Nitrides lasers after BluRay
E-MRS Fall Meeting 2009
Surface morphology of InGaN layers
Participant:
Nanotechnologia PL 2011
began:
2011-09-19
ended:
2011-09-19
Presented:
Nanotechnologia PL 2011
Multicolor laser diode arrays for medical applications
Participant:
17th International Conference on Crystal Growth and Epitaxy - ICCGE-17
began:
2013-08-11
ended:
2013-08-16
Presented:
Publications:
Blue laser diodes manufacturing in Poland
Bowing of epitaxial structures grown on bulk GaN substrates
Built-in electric fields in group III-nitride light emitting quantum structures
Efficiency „droop” in nitride light emitters
GaN substrates with variable surface miscut for laser diode applications
Inhomogeneities of InGaN/GaN MOVPE multi quantum wells grown with two temperatures process studied by transmission electron microscopy.
Microstructure of homoepitaxially grown InGaN/GaN, violet light emitting laser diodes.
Multicolor laser diode arrays for medical applications
Nitrides lasers after BluRay
PLASTIC PROPERTIES OF GaN AND Al_2O_3 CRYSTAL: FEM-SIMULATION OF NANOINDENTATION CONFIRMED BY HIGH-RESOLUTION MICROSCOPY
Polymer film-coated high electron mobility transistors, based on GaN heterostructures, as sensors for some benzene derivatives
Rietveld refinement for polycrystalline indium nitride
Surface morphology of InGaN layers
The Blue Laser
The optimalisation of the GaN and GaN/AlGaN heterojunctions on bulk crystals using plasma-assisted molecular beam epitaxy
X-ray Diffraction as a Tool of InGaN layer Characterization.
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