dr Marek Guziewicz

e-mail:
phone: +48-22-5487952
fax: +48-22-8470631
web:
interest(s):

Affiliation:


Instytut Technologii Elektronowej

address: al. Lotników 32/46, Warszawa, 02-668, Poland
phone: +48-22-5487933
fax:
web:

Participant:


Joint Fith International Conference on Solid State Crystals & Eighth Polish Conference on Crystal Growth

began: 2007-05-20
ended: 2007-05-24
Presented:

Joint Fith International Conference on Solid State Crystals & Eighth Polish Conference on Crystal Growth

Determination of stress in composite engineered substrates for GaN-based RF power devices

Joint Fith International Conference on Solid State Crystals & Eighth Polish Conference on Crystal Growth

Characterization of Ir and IrO2 Schottky contacts on n-type 4H-SiC under high temperature stress

Publications:


  1. Characterization of Ir and IrO2 Schottky contacts on n-type 4H-SiC under high temperature stress
  2. Determination of stress in composite engineered substrates for GaN-based RF power devices
  3. Effect of annealing on electrical properties of low temperature ZnO films
  4. Methods of stress investigations in dielectric layer of MIS structures



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