Search for content and authors
dr Marek Guziewicz
e-mail:
Sorry, you need javascript to view this email address
phone:
+48-22-5487952
fax:
+48-22-8470631
web:
interest(s):
Affiliation:
Instytut Technologii Elektronowej
address:
al. Lotników 32/46, Warszawa, 02-668,
Poland
phone:
+48-22-5487933
fax:
web:
Participant:
Joint Fith International Conference on Solid State Crystals & Eighth Polish Conference on Crystal Growth
began:
2007-05-20
ended:
2007-05-24
Presented:
Joint Fith International Conference on Solid State Crystals & Eighth Polish Conference on Crystal Growth
Determination of stress in composite engineered substrates for GaN-based RF power devices
Joint Fith International Conference on Solid State Crystals & Eighth Polish Conference on Crystal Growth
Characterization of Ir and IrO
2
Schottky contacts on n-type 4H-SiC under high temperature stress
Publications:
Characterization of Ir and IrO
2
Schottky contacts on n-type 4H-SiC under high temperature stress
Determination of stress in composite engineered substrates for GaN-based RF power devices
Effect of annealing on electrical properties of low temperature ZnO films
Methods of stress investigations in dielectric layer of MIS structures
Web
science24.com
© 1998-2024
pielaszek research
, all rights reserved
Powered by
the Conference Engine
