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Krzysztof J. Kozaczek

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Affiliation:

Hypernex, Inc.

address: 3006 Research Drive, State College, PA, 16801, United States
phone: 814-235-0606
fax: 814-235-0605
web: http://hypernexinc.com

Participant:

E-MRS Fall Meeting 2004

began: 2004-09-06
ended: 2004-09-10
Presented:
E-MRS Fall Meeting 2004
Application of 2D detectors in X-ray diffraction based metrology in semiconductor industry

Publications:
  1. Application of 2D detectors in X-ray diffraction based metrology in semiconductor industry



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