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- Jouni Tiilikainen
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Affiliation:
Helsinki University of Technology, Micro and Nanosciences Laboratory, Micronova
address:
, Espoo, 02015,
Finland
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fax:
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Participant:
E-MRS Fall Meeting 2007
began:
2007-09-17
ended:
2007-11-30
Presented:
E-MRS Fall Meeting 2007
Fitting of X-ray reflectivity from periodic thin film structures: Improved convergence properties in genetic algorithm by rotation of coordinates
Publications:
Fitting of X-ray reflectivity from periodic thin film structures: Improved convergence properties in genetic algorithm by rotation of coordinates
Passivation of GaAs surface by using ALD technology
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