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Wayne D. Kaplan |
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Affiliation: |
Technion - Israel Institute of Technology, Dept. of Materials Engineering|
| address: | , Haifa, 32000, Israel | | phone: | | | fax: | | | web: | | |
Affiliation: |
Technion - Israel Institute of Technology, Dept. of Materials Engineering|
| address: | , Haifa, 32000, Israel | | phone: | | | fax: | | | web: | | |
Publications: |
- Correlation between the dielectric constant and porosity of nanoporous silica based thin films
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