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Dmitry Mogilyanski
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Affiliation:
Institutes for Applied Research, Ben Gurion University of the Negev
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, Beer-Sheva, 84105,
Israel
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Publications:
Advantages and disadvantages of fast XRPD measurement by using image-plate and rotating anode source
Formation and characterization of nanocrystalline binary oxides of yttrium and rare earths metals
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