A comparison has been carried out of different methods of X-ray diffraction line broadening analysis  for the determination of crystallite size and microstrains, namely line profile analysis and two approaches based on variance method. The analyses have been applied to data collected on ceria sample conducted by IUCr commission on powder. In variance method Voigt function and its approximation Pseudo-Voigt function were fitted to X-ray diffraction line profile. Based on fit results the variances of line profiles were calculated and then the crystallite size and root mean square strain were obtained from variance coefficients. A ss plot of Langford and Fourier analysis have also been carried out based on powder pattern fitting and crystal size and microstrain were determined. The values of area-weighted and volume-weighted domain size determined from variance method are in agreement with those obtained from line profile analysis within a single (largest) standard uncertainly. But the results of r.m.s. strain calculated from variance are larger than those of determined from LPA or reported by other authors.

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