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J.M. Yi

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Affiliation:


Pohang University of Science and Technology

address: San 31, Hoyja-dong, Nam-gu, Pohang, 790-784, Korea, South
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Participant:


E-MRS Fall Meeting 2004

began: 2004-09-06
ended: 2004-09-10
Presented:

E-MRS Fall Meeting 2004

Grain orientation-location measurement by combined use of x-ray topography with diffractometry

E-MRS Fall Meeting 2004

Microstructure of dislocation slip-band in p/p+ Si (001) by white beam diffraction topography and x-ray diffractometry

Publications:


  1. Grain orientation-location measurement by combined use of x-ray topography with diffractometry
  2. Microstructure of dislocation slip-band in p/p+ Si (001) by white beam diffraction topography and x-ray diffractometry



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