Piotr Dłużewski



Polish Academy of Sciences, Institute of Physics

address: al. Lotników 32/46, Warszawa, 02-668, Poland
phone: +48-22-8436601
fax: +48-22-8430926
web: http://www.ifpan.edu.pl


E-MRS Fall Meeting 2003

began: 2003-09-15
ended: 2003-09-11

E-MRS Fall Meeting 2003

Electron diffraction and microscopy investigations of nanocrystals envelope


E-MRS Fall Meeting 2005

began: 2005-09-05
ended: 2005-09-09


  1. Catalytic growth by molecular beam epitaxy and properties of ZnTe-based semiconductor nanowires
  2. Electron diffraction and microscopy investigations of nanocrystals envelope
  3. Image processing of HREM micrograph for determination size distribution of Co nanocrystals in Cu matrix
  4. Influence of the thin Si cap layer on SiGe quantum dots morphology
  5. MBE growth, structural, magnetic, and electric properties of (In,Ga)As-(Ga,Mn)As core-shell nanowires
  6. Medium scale modeling of the CdTe/ZnTe islands the empirical potential and finite element approach
  7. Microstructure of Fe_3O_4 film grown on Si(100) substrate, investigated by TEM and X-ray methods
  8. Nanoindentation of heterogeneous n-carbon films containing Ni nanocrystals
  9. Promising high quality short period Fe/Fe-N multilayers deposited by the sputtering

  10. Properties of nanostructured carbonaceous films containing Ni nanocrystals
  11. Quantitative study of Cd atoms distribution in CdTe/ZnTe quantum dots superlattice by HRTEM
  12. Quantitative transmission electron microscopy investigation of localised stress in heterostructures
  13. Structure of Si:Mn annealed under enhanced stress conditions
  14. Transmission electron microscopy and X-ray diffraction study of \alpha'-Al_2 CO crystals
  15. Transmission Electron Microscopy characterization of gold nanoparticles
  16. X-ray Absorption Fine Structure study of nickel grains embedded in the carbonaceous films
  17. ZnO and core/shell ZnO/ZnS nanofibers: Characterization and applications

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