PMN-xPT is relaxor ferroelectrics with great potential in the application of novel devices. At the morphotropic phase boundary with x~28%-36% of PT, PMN-xPT exhibits complex crystal structure and phase transformation, which are not fully understood yet. The ferroelectric domain evolution study may reveal the mechanism of phase transformations induced by temperature or electrical field. In this work, we report the study of domain evolution of PMN-30~31%PT single crystal by means of temperature-dependent piezoresponse force microscopy (PFM) and electrical measurement. Observation of poled sample revealed that stripe-shaped domains are developed from an unstable single domain structure (generated from poling) through the aggregation and self alignment of polar nanosized regions (PNRs). Temperature-dependent PFM of the poled sample revealed a domain evolution process. During temperature increase, the stripe-shaped domains become larger through the growth and aggregation of PNRs, and the phase transformation from rhombohedral to tetragonal phase is progressing according to polarization rotation. When temperature is higher than T_m, the domain contrast becomes very weak and finally disappears. After heating and cooling cycle, the PNRs and microdomains with random arrangement can be observed in the PFM image.

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