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Diameter control of single-walled carbon nanotubes by selective oxidation

Ryszard J. Kaleńczuk 

Technical University of Szczecin, Institute of Chemical and Environment Engineering, Pulaskiego 10, Szczecin 70-322, Poland

Abstract


Diameter control of single-walled carbon nanotubes by selective
oxidation

E. Borowiak-Palen1,3, X. Liu1, T. Pichler1,2, M. Knupfer1, J. Fink1,
O. Jost4,
W. Pompe4, R.J. Kalenczuk3

1) IFW-Dresden, Helmholtzstr.20, D-01069 Dresden, Germany
2) Institut fuer Materialphysik der Universitaet Wien, Strudehofg
4, A-1090 Wien, Austria
3) Institute of Chemical and Environment Engineering, Technical
University of Szczecin, Pulaskiego st.10, 70-322 Szczecin, Poland
4) Institut fuer Werkstoffwissenschaft der TU Dresden, D-01062
Dresden, Germany


For the application of single wall carbon nanotubes (SWCNT) there are
two main goals of purification treatments attempts: to keep the SWCNT
as defect free as possible and to control the number of defects on the
SWCNT, as well as to separate SWCNT by chirality, diameter and length.
After optimization of the production process of SWCNT using laser
ablation regarding the SWCNT yield we obtain a soot which consists of
70 % of bundles of SWCNT with a finite length, diameter and chirality
distribution. Both a chemical treatment as well as oxidation in a
reduced O[2] atmosphere lead to a selective burning of the small SWNT
and to a diameter distribution which is narrowed by a factor of two.
In addition, during the high vacuum annealing, which is part of O[2]
burning procedure, of the SWNT the catalyst particles are still
active. This leads to the formation of very thin SWCNT with a narrow
diameter distribution.

In this contribution we present a comparative study of the success of
different multistep purification
attempts. After each step the result of the purification effort was
monitored by
optical spectroscopy, TEM, SEM and atomic absorption spectroscopy
(AAS).

 

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Presentation: poster at E-MRS Fall Meeting 2002, by Ryszard J. Kaleńczuk
See On-line Journal of E-MRS Fall Meeting 2002

Submitted: 2003-02-16 17:33
Revised:   2009-06-08 12:55