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Spectroscopic properties of Yb3+-doped Bi4Si3O12 single crystal

Yan Zhang ,  Jiayue Xu ,  Baoliang Lu ,  Bobo Yang 

Shanghai Institute of technology (SIT), Haiquan Road, Fengxian, Shanghai 201418, China

Abstract

Yb3+-doped Bi4Si3O12 single crystals with good optical quality have been grown by the modified vertical Bridgman method. The crystalline quality of the Yb3+: Bi4Si3O12 single crystal was verified by the width of the X-ray diffraction (XRD) peak in the X-ray rocking curves measurement. The absorption spectrum and emission spectra and fluorescence lifetime of the Yb3+: Bi4Si3O12 crystal were detected at room temperature. The spectral and laser parameters of Yb3+: Bi4Si3O12 crystal have been calculated.

 

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Presentation: Poster at 17th International Conference on Crystal Growth and Epitaxy - ICCGE-17, General Session 2, by Yan Zhang
See On-line Journal of 17th International Conference on Crystal Growth and Epitaxy - ICCGE-17

Submitted: 2013-04-15 12:01
Revised:   2013-04-15 13:24